2010, ISBN: 3642077781
[EAN: 9783642077784], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], MICROELECTRONICS; RADIATIONDAMAGE; SEMICONDUCTORDEVICESANDCIRCUITS; SPACEANDNUCLEARELECTRONICS; ULSITECHNOLOGY;… Más…
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2010, ISBN: 9783642077784
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2010, ISBN: 9783642077784
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2010, ISBN: 3642077781
[EAN: 9783642077784], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], MICROELECTRONICS; RADIATIONDAMAGE; SEMICONDUCTORDEVICESANDCIRCUITS; SPACEANDNUCLEARELECTRONICS; ULSITECHNOLOGY;… Más…
Claeys, C.;Simoen, E.:
Radiation Effects in Advanced Semiconductor Materials and Devices - Pasta blanda2010, ISBN: 9783642077784
[ED: Softcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining … Más…
2010
ISBN: 9783642077784
Pasta blanda
[ED: Kartoniert / Broschiert], [PU: Springer Berlin Heidelberg], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book summarizes the … Más…
2010, ISBN: 3642077781
Pasta dura
Softcover reprint of hardcover 1st ed. 2002 Kartoniert / Broschiert Elektrizität, Magnetismus und Elektromagnetismus, Umwelt, Materialwissenschaft, Werkstoffprüfung, microelectronics; r… Más…
2010, ISBN: 9783642077784
Buch, Softcover, Softcover reprint of hardcover 1st ed. 2002, [PU: Springer Berlin], Springer Berlin, 2010
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Radiation Effects in Advanced Semiconductor Materials and Devices
EAN (ISBN-13): 9783642077784
ISBN (ISBN-10): 3642077781
Tapa dura
Tapa blanda
Año de publicación: 2010
Editorial: Springer Berlin
428 Páginas
Peso: 0,643 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2010-09-24T21:40:28+02:00 (Madrid)
Página de detalles modificada por última vez el 2023-08-11T14:39:26+02:00 (Madrid)
ISBN/EAN: 3642077781
ISBN - escritura alterna:
3-642-07778-1, 978-3-642-07778-4
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: claeys, cor, eddy, simoen
Título del libro: radiation effects advanced, semiconductor devices, the effects radiation materials
Datos del la editorial
Autor: C. Claeys; E. Simoen
Título: Springer Series in Materials Science; Radiation Effects in Advanced Semiconductor Materials and Devices
Editorial: Springer; Springer Berlin
404 Páginas
Año de publicación: 2010-12-01
Berlin; Heidelberg; DE
Impreso en
Idioma: Inglés
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XXII, 404 p.
BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Microelectronics; Radiation damage; Semiconductor; Semiconductor devices and circuits; Space and nuclear electronics; ULSI Technology; environment; modeling; Crystallography and Scattering Methods; Energy Policy, Economics and Management; Classical Electrodynamics; Characterization and Analytical Technique; Optical Materials; Surfaces, Interfaces and Thin Film; Umwelt; Elektrizität, Magnetismus und Elektromagnetismus; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Materialwissenschaft; BB
In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.This book summarizes the current knowledge of radiation defects in semiconductors It will be a useful reference work for scientists involved in semiconductor processing.- This book is important for space applications of semiconductors and solar cells.- It provides information on the application of sensors in nuclear power plants.
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