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Inside NAND Flash Memories - Rino Micheloni
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Inside NAND Flash Memories - encuadernado, tapa blanda

2010, ISBN: 904819430X

[EAN: 9789048194308], Neubuch, [SC: 0.0], [PU: Springer Netherlands], BAUELEMENT (ELEKTRONISCH) - BAUSTEIN (ELEKTRONISCH); ELEKTRONIK / BAUELEMENTE; CHEMIE; EXPERIMENT; VERSUCH; FESTKÖRPE… Más…

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Inside NAND Flash Memories - Crippa, Luca;Marelli, Alessia;Micheloni, Rino
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Crippa, Luca;Marelli, Alessia;Micheloni, Rino:

Inside NAND Flash Memories - encuadernado, tapa blanda

2010, ISBN: 9789048194308

[ED: Hardcover], [PU: Springer / Springer Netherlands], Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media.To realize how much NAN… Más…

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Inside NAND Flash Memories Rino Micheloni Author
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Inside NAND Flash Memories Rino Micheloni Author - libro nuevo

ISBN: 9789048194308

Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Más…

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Inside NAND Flash Memories - libro nuevo

ISBN: 9789048194308

Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Más…

Nr. 978-90-481-9430-8. Gastos de envío:Worldwide free shipping, , DE. (EUR 0.00)
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Inside NAND Flash Memories | Rino Micheloni (u. a.) | Buch | HC gerader Rücken kaschiert | X | Englisch | 2010 | Springer Netherland | EAN 9789048194308 - Micheloni, Rino
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Micheloni, Rino:
Inside NAND Flash Memories | Rino Micheloni (u. a.) | Buch | HC gerader Rücken kaschiert | X | Englisch | 2010 | Springer Netherland | EAN 9789048194308 - encuadernado, tapa blanda

2010, ISBN: 9789048194308

[ED: Gebunden], [PU: Springer Netherland], Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memo… Más…

Gastos de envío:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) preigu

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Detalles del libro
Inside NAND Flash Memories Rino Micheloni Author

Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just imagine how our recent habits would change if the NAND memories suddenly disappeared. To take a picture it would be necessary to find a film (as well as a traditional camera...), disks or even magnetic tapes would be used to record a video or to listen a song, and a cellular phone would return to be a simple mean of communication rather than a multimedia console. The development of NAND Flash memories will not be set down on the mere evolution of personal entertainment systems since a new killer application can trigger a further success: the replacement of Hard Disk Drives (HDDs) with Solid State Drives (SSDs). SSD is made up by a microcontroller and several NANDs. As NAND is the technology driver for IC circuits, Flash designers and technologists have to deal with a lot of challenges. Therefore, SSD (system) developers must understand Flash technology in order to exploit its benefits and countermeasure its weaknesses. Inside NAND Flash Memories is a comprehensive guide of the NAND world: from circuits design (analog and digital) to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from error correction codes to NAND applications like Flash cards and SSDs.

Detalles del libro - Inside NAND Flash Memories Rino Micheloni Author


EAN (ISBN-13): 9789048194308
ISBN (ISBN-10): 904819430X
Tapa dura
Tapa blanda
Año de publicación: 2010
Editorial: Springer Netherlands Core >2 >T
582 Páginas
Peso: 1,024 kg
Idioma: eng/Englisch

Libro en la base de datos desde 2007-09-15T14:16:07+02:00 (Madrid)
Página de detalles modificada por última vez el 2024-03-16T15:04:06+01:00 (Madrid)
ISBN/EAN: 904819430X

ISBN - escritura alterna:
90-481-9430-X, 978-90-481-9430-8
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: luca crippa, marelli
Título del libro: inside outside, look inside, flash art, memories 1978 1985


Datos del la editorial

Autor: Rino Micheloni; Luca Crippa; Alessia Marelli
Título: Inside NAND Flash Memories
Editorial: Springer; Springer Netherland
582 Páginas
Año de publicación: 2010-08-18
Dordrecht; NL
Impreso en
Idioma: Inglés
246,09 € (DE)
252,99 € (AT)
271,50 CHF (CH)
POD
X, 582 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Devices; Flash Memories; NAND Memories; Solid State Circuits; integrated circuit; single-electron transistor; static-induction transistor; Electronic Circuits and Systems; Mass Spectrometry; Condensed Matter Physics; Spectroscopy; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC

Preface. Acknowledgements. 1 Market and applications for NAND flash memories; Gregory Wong. 2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro. 3 Program and erase of NAND memory arrays; Cristoph Friederich. 4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo. 5 Charge trap NAND technologies ; Alessandro Grossi. 6 Control logic; A. Marelli, R. Micheloni and R. Ravasio. 7 NAND DDR interface; Andrea Silvagni. 8 Sensing circuits; L. Crippa and R. Micheloni. 9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni. 10 MLC storage; L. Crippa and R. Micheloni. 11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa. 12 High voltage overview; R. Micheloni and A. Marelli. 13 Redundancy; A. Marelli and R. Micheloni . 14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni. 15 NAND design for testability and testing; Andrea Silvagni. 16 XLC storage; R. Micheloni and L. Crippa. 17 Flash cards; A. Ghilardelli and S. Corno. 18 Low power 3D-integrated SSD; K. Takeuchi. 19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella. About the authors. Index.
Flash NAND design NAND – SSD co-development Radiation effects on Flash memories Charge trap technology overview Includes supplementary material: sn.pub/extras

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