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Noncontact Atomic Force Microscopy | Volume 3 | Seizo Morita (u. a.) | Buch | NanoScience and Technology | HC runder Rücken kaschiert | Englisch | 2015 | Springer International Publishing - Morita, Seizo
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Morita, Seizo:

Noncontact Atomic Force Microscopy | Volume 3 | Seizo Morita (u. a.) | Buch | NanoScience and Technology | HC runder Rücken kaschiert | Englisch | 2015 | Springer International Publishing - encuadernado, tapa blanda

2015, ISBN: 9783319155876

[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… Más…

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Noncontact Atomic Force Microscopy - Seizo Morita
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Seizo Morita:

Noncontact Atomic Force Microscopy - libro nuevo

2002, ISBN: 9783319155876

[ED: Buch], [PU: Springer International Publishing], Neuware - This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding fu… Más…

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Noncontact Atomic Force Microscopy - Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
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Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger:
Noncontact Atomic Force Microscopy - encuadernado, tapa blanda

2015

ISBN: 9783319155876

Volume 3, Buch, Hardcover, 2015, This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that … Más…

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Noncontact Atomic Force Microscopy / Volume 3 / Seizo Morita (u. a.) / Buch / NanoScience and Technology / HC runder Rücken kaschiert / Englisch / 2015 / Springer International Publishing - Morita, Seizo
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Morita, Seizo:
Noncontact Atomic Force Microscopy / Volume 3 / Seizo Morita (u. a.) / Buch / NanoScience and Technology / HC runder Rücken kaschiert / Englisch / 2015 / Springer International Publishing - encuadernado, tapa blanda

2015, ISBN: 9783319155876

[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… Más…

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Noncontact Atomic Force Microscopy Volume 3 - Morita, Seizo (Herausgeber); Wiesendanger, Roland (Herausgeber); Meyer, Ernst (Herausgeber); Giessibl, Franz J. (Herausgeber)
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Morita, Seizo (Herausgeber); Wiesendanger, Roland (Herausgeber); Meyer, Ernst (Herausgeber); Giessibl, Franz J. (Herausgeber):
Noncontact Atomic Force Microscopy Volume 3 - encuadernado, tapa blanda

2015, ISBN: 3319155873

2015 Gebundene Ausgabe Mikroskopie, Nanotechnologie, Technologie / Nanotechnologie, Spektroskopie, Nanowissenschaften, Spektroskopie, Spektrochemie, Massenspektrometrie, Materialwissens… Más…

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Detalles del libro
Noncontact Atomic Force Microscopy
Autor:
Título:
ISBN:

9783319155876


This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Detalles del libro - Noncontact Atomic Force Microscopy


EAN (ISBN-13): 9783319155876
ISBN (ISBN-10): 3319155873
Tapa dura
Año de publicación: 2009
Editorial: Springer International Publishing

Libro en la base de datos desde 2015-08-07T14:52:55+02:00 (Madrid)
Página de detalles modificada por última vez el 2023-04-11T17:48:58+02:00 (Madrid)
ISBN/EAN: 9783319155876

ISBN - escritura alterna:
3-319-15587-3, 978-3-319-15587-6
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: ernst meyer, gies, ernst wies, roland wiesendanger, meyer franz, morita
Título del libro: force, atomic, morita, international volume

Datos del la editorial

Autor: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
Título: NanoScience and Technology; Noncontact Atomic Force Microscopy - Volume 3
Editorial: Springer; Springer International Publishing
527 Páginas
Año de publicación: 2015-06-02
Cham; CH
Impreso en
Idioma: Inglés
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XXII, 527 p. 256 illus., 159 illus. in color.

BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Atom Manipulation; Atomic Force Microscopy; Atomic Resolution; Atomic/Molecular Manipulation; Chemical Structure; Force Mapping with Atomic Resolution; Liquid AFM; Magnetic Exchange Force Microscopy; Scanning Probe Techniques; Scanning Tunneling Microscopy; Nanophysics; Surfaces, Interfaces and Thin Film; Spectroscopy; Nanotechnology; Nanowissenschaften; Materialwissenschaft; Spektroskopie, Spektrochemie, Massenspektrometrie; Nanotechnologie; EA; BC

From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.
Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Includes supplementary material: sn.pub/extras
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