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2010, ISBN: 3642087183
[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg], Druck auf Anfrage Neuware - Printed after ordering - Transmission electron microscopy (TEM) is now recognized as a crucial… Más…
2010, ISBN: 3642087183
[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg Okt 2010], This item is printed on demand - it takes 3-4 days longer - Neuware -Transmission electron microscopy (TEM) is no… Más…
ISBN: 9783642087189
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many asp… Más…
2010, ISBN: 3642087183
Pasta dura
Softcover reprint of hardcover 1st ed. 2001 Kartoniert / Broschiert Wissenschaftliche Standards, Normung usw., Nanotechnologie, Materialwissenschaft, mit Schutzumschlag 11, [PU:Springer… Más…
2010, ISBN: 9783642087189
Pasta blanda
Applications in Materials Science, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2001, [PU: Springer Berlin], Springer Berlin, 2010
Datos bibliográficos del mejor libro coincidente
| Autor: | |
| Título: | |
| ISBN: |
Detalles del libro - Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor
EAN (ISBN-13): 9783642087189
ISBN (ISBN-10): 3642087183
Tapa dura
Tapa blanda
Año de publicación: 2010
Editorial: Springer Berlin Heidelberg Core >1 >T
328 Páginas
Peso: 0,497 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2011-02-05T11:39:57+01:00 (Madrid)
Página de detalles modificada por última vez el 2024-01-11T21:28:33+01:00 (Madrid)
ISBN/EAN: 3642087183
ISBN - escritura alterna:
3-642-08718-3, 978-3-642-08718-9
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: zhang xiao, zhang feng
Título del libro: progress materials science, transmission, electron microscopy, surface science series
Datos del la editorial
Autor: Xiao-Feng Zhang; Ze Zhang
Título: Springer Series in Surface Sciences; Progress in Transmission Electron Microscopy 2 - Applications in Materials Science
Editorial: Springer; Springer Berlin
307 Páginas
Año de publicación: 2010-10-19
Berlin; Heidelberg; DE
Impreso en
Idioma: Inglés
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XIV, 307 p.
BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Materialwissenschaft; Verstehen; Surfaces, Interfaces and Thin Film; Measurement Science and Instrumentation; Nanotechnology; Characterization and Analytical Technique; Wissenschaftliche Standards, Normung usw. Nanotechnologie; Werkstoffprüfung; BB
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.Reviews the modern developments that have made transmission electron microscopy indispensible for materials research Includes supplementary material: sn.pub/extras
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