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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suné, Giuseppe LaRosa, Stewart E. Rauch, III, Timothy D. Sullivan
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Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suné, Giuseppe LaRosa, Stewart E. Rauch, III, Timothy D. Sullivan:

Reliability Wearout Mechanisms in Advanced CMOS Technologies - encuadernado, tapa blanda

2009, ISBN: 9780471731726

It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent t… Más…

100.0, Zahlungsarten: Paypal, APPLE_PAY, Google Pay, Visa, Mastercard, American Express. Gastos de envío:Versand zum Fixpreis, [SHT: Standardversand], 22*** Hamburg, [TO: Weltweit] (EUR 5.50) booksof_22
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.
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Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.:

Reliability Wearout Mechanisms in Advanced CMOS Technologies - encuadernado, tapa blanda

2009, ISBN: 0471731722

[EAN: 9780471731726], Neubuch, [PU: Wiley & Sons|Wiley-IEEE Press], TECHNOLOGY & INDUSTRIAL ARTS ENGINEERING ELECTRICAL TECHNIK ELEKTRONIK ELEKTROTECHNIK NACHRICHTENTECHNIK TECHNISCHE ZUV… Más…

NEW BOOK. Gastos de envío:Versandkostenfrei. (EUR 0.00) moluna, Greven, Germany [73551232] [Rating: 5 (von 5)]
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch
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Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - Primera edición

2009

ISBN: 9780471731726

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[ED: Gebunden], [PU: John Wiley & Sons], ALVIN W. STRONG, PhD, is retired from IBM in Essex Junction, Vermont. He holds nineteen patents, has authored or coauthored a number of papers, an… Más…

Gastos de envío:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) Moluna GmbH
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Strong, Alvin W, and Wu, Ernest Y, and Vollertsen, Rolf-Peter:
Reliability Wearout Mechanisms in Advanced Cmos Technologies - encuadernado, tapa blanda

2009, ISBN: 9780471731726

Hard cover, New Book Original US edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed., Brand New, [PU: Wiley-IEEE Press]

IND - IndiaGastos de envío:más gastos de envío New Delhi, NEW DELHI, Firstbookstore
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa
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Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - encuadernado, tapa blanda

2009, ISBN: 9780471731726

Buch, Hardcover, [PU: Wiley-IEEE Press], Wiley-IEEE Press, 2009

Gastos de envío:Versand in 10-15 Tagen. (EUR 0.00)

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Detalles del libro
Reliability Wearout Mechanisms in Advanced CMOS Technologies

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

Detalles del libro - Reliability Wearout Mechanisms in Advanced CMOS Technologies


EAN (ISBN-13): 9780471731726
ISBN (ISBN-10): 0471731722
Tapa dura
Tapa blanda
Año de publicación: 2009
Editorial: Wiley-IEEE Press
624 Páginas
Peso: 0,980 kg
Idioma: eng/Englisch

Libro en la base de datos desde 2007-07-05T07:08:40+02:00 (Madrid)
Página de detalles modificada por última vez el 2024-03-08T15:28:43+01:00 (Madrid)
ISBN/EAN: 9780471731726

ISBN - escritura alterna:
0-471-73172-2, 978-0-471-73172-6
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: rosa peter, guiseppe, peter rauch, stewart, peter spain, rosa giuseppe, vollertsen rolf, volle, strong, vollert
Título del libro: cmos technologie, reliability for the technologies, series advanced, reliability wearout mechanisms advanced cmos technologies


Datos del la editorial

Autor: Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa; Timothy D. Sullivan; Stewart E. Rauch
Título: IEEE Press Series on Microelectronic Systems; Reliability Wearout Mechanisms in Advanced CMOS Technologies
Editorial: John Wiley & Sons
624 Páginas
Año de publicación: 2009-09-04
Peso: 0,966 kg
Idioma: Inglés
165,00 € (DE)
No longer receiving updates
164mm x 238mm x 33mm

BB; gebunden; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Quality & Reliability; Schaltkreise - Theorie u. Entwurf; Circuit Theory & Design; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI; Electrical & Electronics Engineering; CMOS; Schaltkreistechnik; Circuit Theory & Design / VLSI / ULSI; Technische Zuverlässigkeit; Elektrotechnik u. Elektronik; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

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