2012, ISBN: 7565006432

[EAN: 9787565006432], Neubuch, Paperback. Pub Date: 2012 Pages: 181 in Publisher: Hefei University Press Contents: Chapter 1 circuit and electronics technology experiments basics 1.1 Circ… Más…

[EAN: 9787565006432], Neubuch, Paperback. Pub Date: 2012 Pages: 181 in Publisher: Hefei University Press Contents: Chapter 1 circuit and electronics technology experiments basics 1.1 Circuit and Electronic Technology Experiment Conditions 1.2 circuit and electronic experimental methods 1.3 measurement error and error Analysis 1.4 measurement data processing the grounding analysis 1.6 1.5 circuit circuit debugging techniques 1.7 Experimental failure analysis and processing Chapter 2 circuit analysis of experiments 2.1 2.2 Kirchhoff's law 2.3. the principle of superposition of the potential. voltage measurement and mapping of circuit potential verification 2.5 2.4 Thevenin's theorem and Norton theorems verification controlled source VCVS 2.6 Typical electrical signals VCCS. CCVS. CCCS experimental study observation 2.8 second-order dynamic circuit response test measuring 2.7 RC-order circuit response study 2.9 R L. the determination of the C component impedance characteristics the 2.10 AC circuit equivalent parameters measuring 2.11 sinusoidal steady state AC circuit phasor 2.12 RC frequency selective network characteristics test 2.13 RLC series resonant circuit 214 dual-port network test 2.15 three-phase circuit study of the differential amplifier design 3.3 3.2 single-tube amplifier circuit transistor amplifier measurement of voltage. current. power. Chapter 3. Analog Electronic Technology Experiment 3.1 static tone measured gain test and test 3.4 two resistive and capacitive coupling amplifier circuit 3.5 negative feedback amplifier Research 3.6 integrated operational amplifier applications: basic arithmetic circuit 3.7 RC sine wave oscillator circuit 3.8 voltage comparator 3.9 waveform occurrence of an integrated voltage regulator of the DC power supply of circuit 3.10 rectifier filter shunt regulator circuit 3.11 3.12 Integrated Operational Amplifier basic application design 3.13 active filter 3.14 OTL power amplifier circuit Chapter 4 Digital Electronic Technology Experiment 4.1 circuit functional testing and application of MAX 4.2 + the plus11 software people door 4.3 integrated logic gate circuit parameters test 4.4 scale combinatorial logic circuit design scale combinatorial logic circuit design (a) 4.5 (b) 4.6 trigger function test and application 4.7 shift register their 4.8 scale counter and its application of of 4.9 sequential logic circuit analysis and design of 4.10 pulse with shaping circuit 4.11 4.13 traffic light controller design of the design of the automatic control circuit of 555 timer 4.12 high-rise elevator Appendix Appendix A commonly used electronic instruments instrument Introduction Appendix B common resistors. capacitors Appendix C commonly used semiconductor diodes. transistors commonly integrated computing introduced in Appendix D the amplifier parameter and pin arrangement of Appendix E MAX + plusII software introduced integrated chip pin diagram of Appendix F References.Generally,Ship out in 2 business day, and provider Tracking number after the shipment.Four Satisfaction guaranteed,or money back.<

2012, ISBN: 9787565006432

Hefei University Press. paperback. New. Ship out in 2 business day, And Fast shipping, Free Tracking number will be provided after the shipment.Paperback. Pub Date: 2012 Pages: 181 in P… Más…

Hefei University Press. paperback. New. Ship out in 2 business day, And Fast shipping, Free Tracking number will be provided after the shipment.Paperback. Pub Date: 2012 Pages: 181 in Publisher: Hefei University Press Contents: Chapter 1 circuit and electronics technology experiments basics 1.1 Circuit and Electronic Technology Experiment Conditions 1.2 circuit and electronic experimental methods 1.3 measurement error and error Analysis 1.4 measurement data processing the grounding analysis 1.6 1.5 circuit circuit debugging techniques 1.7 Experimental failure analysis and processing Chapter 2 circuit analysis of experiments 2.1 2.2 K... Satisfaction guaranteed,or money back., Hefei University Press, 6<

2012, ISBN: 7565006432

[EAN: 9787565006432], Neubuch, Paperback. Pub Date: 2012 Pages: 181 in Publisher: Hefei University Press Contents: Chapter 1 circuit and electronics technology experiments basics 1.1 Circ… Más…

[EAN: 9787565006432], Neubuch, Paperback. Pub Date: 2012 Pages: 181 in Publisher: Hefei University Press Contents: Chapter 1 circuit and electronics technology experiments basics 1.1 Circuit and Electronic Technology Experiment Conditions 1.2 circuit and electronic experimental methods 1.3 measurement error and error Analysis 1.4 measurement data processing the grounding analysis 1.6 1.5 circuit circuit debugging techniques 1.7 Experimental failure analysis and processing Chapter 2 circuit analysis of experiments 2.1 2.2 K.<