2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… Más…
booklooker.de |
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - encuadernado, tapa blanda
2009, ISBN: 9781441909275
[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … Más…
booklooker.de |
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… Más…
booklooker.de |
2010, ISBN: 9781441909275
*Power-Aware Testing and Test Strategies for Low Power Devices* - 2010 edition / gebundene Ausgabe für 160.49 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Medien > Bücher nein Buch … Más…
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2009, ISBN: 9781441909275
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… Más…
booklooker.de |
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… Más…
Girard, Patrick:
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - encuadernado, tapa blanda2009, ISBN: 9781441909275
[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … Más…
2001
ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… Más…
2010, ISBN: 9781441909275
*Power-Aware Testing and Test Strategies for Low Power Devices* - 2010 edition / gebundene Ausgabe für 160.49 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Medien > Bücher nein Buch … Más…
2009, ISBN: 9781441909275
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… Más…
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Power-Aware Testing and Test Strategies for Low Power Devices
EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Tapa dura
Tapa blanda
Año de publicación: 2009
Editorial: Springer Nature Singapore
363 Páginas
Peso: 0,717 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2009-11-13T20:04:16+01:00 (Madrid)
Página de detalles modificada por última vez el 2024-04-19T02:28:16+02:00 (Madrid)
ISBN/EAN: 9781441909275
ISBN - escritura alterna:
1-4419-0927-3, 978-1-4419-0927-5
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: girard patrick, xiaoqi
Título del libro: test, the power now
Datos del la editorial
Autor: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Título: Power-Aware Testing and Test Strategies for Low Power Devices
Editorial: Springer; Springer US
363 Páginas
Año de publicación: 2009-11-23
New York; NY; US
Impreso en
Idioma: Inglés
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXI, 363 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC
Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
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