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Advanced Test Methods for SRAMs - Alberto Bosio & Luigi Dilillo & Patrick Girard & Serge Pravossoudovitch & Arnaud Virazel
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Alberto Bosio & Luigi Dilillo & Patrick Girard & Serge Pravossoudovitch & Arnaud Virazel:

Advanced Test Methods for SRAMs - libro nuevo

ISBN: 9781441909381

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the tec… Más…

Nr. A1031452127. Gastos de envío:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Sofort per Download lieferbar, zzgl. Versandkosten. (EUR 17.43)
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Advanced Test Methods for SRAMs - Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
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Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel:

Advanced Test Methods for SRAMs - libro nuevo

2009, ISBN: 9781441909381

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, eBooks, eBook Download (PDF), 2010, Modern electronics depend on nanoscaled technologies that present new chall… Más…

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Advanced Test Methods for SRAMs - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for SRAMs - libro nuevo

ISBN: 1441909389

Advanced Test Methods for SRAMs ab 106.99 € als pdf eBook: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Comp… Más…

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Advanced Test Methods For Srams - Bosio
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ISBN: 9781441909381

A digital copy of "Advanced Test Methods For Srams" by Bosio. Download is immediately available upon purchase! 9781441909381,1441909389,advanced,test,methods,srams,bosio eBook, Vitalsour… Más…

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Advanced Test Methods for SRAMs - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for SRAMs - libro nuevo

ISBN: 9781441909381

*Advanced Test Methods for SRAMs* - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / pdf eBook für 96.49 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Co… Más…

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Advanced Test Methods for SRAMs
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9781441909381

Detalles del libro - Advanced Test Methods for SRAMs


EAN (ISBN-13): 9781441909381
ISBN (ISBN-10): 1441909389
Año de publicación: 2009
Editorial: Springer US
171 Páginas
Idioma: eng/Englisch

Libro en la base de datos desde 2010-02-23T18:29:29+01:00 (Madrid)
Página de detalles modificada por última vez el 2023-08-11T08:36:07+02:00 (Madrid)
ISBN/EAN: 9781441909381

ISBN - escritura alterna:
1-4419-0938-9, 978-1-4419-0938-1
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: serge, bosio, girard patrick, arnaud
Título del libro: test, advanced method, sram

Datos del la editorial

Autor: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
Título: Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Editorial: Springer; Springer US
171 Páginas
Año de publicación: 2009-10-08
New York; NY; US
Idioma: Inglés
96,29 € (DE)
99,00 € (AT)
118,00 CHF (CH)
Available
XV, 171 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testing; Technologie; currmssc; design; diagnosis; electronics; semiconductor; technology; testing; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BC

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
First book to present complete, state-of-the-art coverage of dynamic fault memory testing Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.) Includes Spice simulation files and an SRAM logic fault simulator Includes supplementary material: sn.pub/extras
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