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2010, ISBN: 9789048181124
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2010, ISBN: 9789048181124
Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solu… Más…
ISBN: 9789048181124
Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Lev… Más…
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Pasta blanda
2010
ISBN: 9789048181124
Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Pro… Más…
2010, ISBN: 9048181127
Pasta dura
Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automaticdebugging; Errordiagnosis; Errorrepair; P… Más…
2009, ISBN: 9048181127
Pasta dura
Functional Design Errors in Digital Circuits ab 149.99 € als Taschenbuch: Diagnosis Correction and Repair. Softcover reprint of hardcover 1st ed. 2009. Aus dem Bereich: Bücher, Taschenbüc… Más…
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Detalles del libro - Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)
EAN (ISBN-13): 9789048181124
ISBN (ISBN-10): 9048181127
Tapa dura
Tapa blanda
Año de publicación: 2010
Editorial: Springer
224 Páginas
Peso: 0,345 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2011-04-08T00:51:00+02:00 (Madrid)
Página de detalles modificada por última vez el 2023-11-16T22:13:08+01:00 (Madrid)
ISBN/EAN: 9789048181124
ISBN - escritura alterna:
90-481-8112-7, 978-90-481-8112-4
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: markov, chang, hui kai
Título del libro: error design, function circuits, electrical engineering, hui kai
Datos del la editorial
Autor: Kai-hui Chang; Igor L. Markov; Valeria Bertacco
Título: Lecture Notes in Electrical Engineering; Functional Design Errors in Digital Circuits - Diagnosis Correction and Repair
Editorial: Springer; Springer Netherland
200 Páginas
Año de publicación: 2010-10-28
Dordrecht; NL
Impreso en
Idioma: Inglés
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXIV, 200 p.
BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; formal verification; integrated circuit; layout; simulation; verification; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Logic Design; Computer-Aided Design (CAD); Rechnerarchitektur und Logik-Entwurf; BB; EA
Background and Prior Art.- Current Landscape in Design and Verification.- Finding Bugs and Repairing Circuits.- FogClear Methodologies and Theoretical Advances in Error Repair.- Circuit Design and Verification Methodologies.- Counterexample-Guided Error-Repair Framework.- Signature-Based Resynthesis Techniques.- Symmetry-Based Rewiring.- FogClear Components.- Bug Trace Minimization.- Functional Error Diagnosis and Correction.- Incremental Verification for Physical Synthesis.- Post-Silicon Debugging and Layout Repair.- Methodologies for Spare-Cell Insertion.- Conclusions.Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solutions: from RTL to post-silicon debugging The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources First empirical comparison of several methods for spare-cell insertion A variety of examples and figures to illustrate key concepts and algorithms
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