- 5 Resultados
precio mínimo: € 138,10, precio máximo: € 176,14, precio promedio: € 157,01
1
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Kai-Hui Chang, Valeria Bertacco, Igor L. Markov
Pedir
por buchfreund.de
€ 176,14
Envío: € 0,001
PedirEnlace patrocinado
Kai-Hui Chang, Valeria Bertacco, Igor L. Markov:

Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - libro nuevo

2010, ISBN: 9789048181124

Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solu… Más…

Gastos de envío:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES Buch- und Medienhandel, 14621 Schönwalde-Glien
2
Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters
Pedir
por Indigo.ca
C$ 222,50
(aprox. € 164,91)
PedirEnlace patrocinado
Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters - libro nuevo

ISBN: 9789048181124

Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Lev… Más…

new in stock. Gastos de envío:zzgl. Versandkosten., más gastos de envío
3
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Chang, Kai-hui
Pedir
por Amazon.de (Intern. Bücher)
€ 138,10
Envío: € 3,001
PedirEnlace patrocinado
Chang, Kai-hui:
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Pasta blanda

2010

ISBN: 9789048181124

Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Pro… Más…

Gastos de envío:Gewöhnlich versandfertig in 6 bis 7 Tagen. Die angegebenen Versandkosten können von den tatsächlichen Kosten abweichen. (EUR 3.00) preigu
4
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.
Pedir
por Achtung-Buecher.de
€ 155,91
Envío: € 0,001
PedirEnlace patrocinado
Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.:
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Pasta blanda

2010, ISBN: 9048181127

Pasta dura

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automaticdebugging; Errordiagnosis; Errorrepair; P… Más…

Gastos de envío:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien
5
Functional Design Errors in Digital Circuits - Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov
Pedir
por Hugendubel.de
€ 149,99
Envío: € 0,001
PedirEnlace patrocinado
Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov:
Functional Design Errors in Digital Circuits - Pasta blanda

2009, ISBN: 9048181127

Pasta dura

Functional Design Errors in Digital Circuits ab 149.99 € als Taschenbuch: Diagnosis Correction and Repair. Softcover reprint of hardcover 1st ed. 2009. Aus dem Bereich: Bücher, Taschenbüc… Más…

Nr. 14051560. Gastos de envío:, , DE. (EUR 0.00)

1Dado que algunas plataformas no nos comunican las condiciones de envío y éstas pueden depender del país de entrega, del precio de compra, del peso y tamaño del artículo, de una posible membresía a la plataforma, de una entrega directa por parte de la plataforma o a través de un tercero (Marketplace), etc., es posible que los gastos de envío indicados por eurolibro/terralibro no concuerden con los de la plataforma ofertante.

Datos bibliográficos del mejor libro coincidente

Detalles del libro
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

Detalles del libro - Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)


EAN (ISBN-13): 9789048181124
ISBN (ISBN-10): 9048181127
Tapa dura
Tapa blanda
Año de publicación: 2010
Editorial: Springer
224 Páginas
Peso: 0,345 kg
Idioma: eng/Englisch

Libro en la base de datos desde 2011-04-08T00:51:00+02:00 (Madrid)
Página de detalles modificada por última vez el 2023-11-16T22:13:08+01:00 (Madrid)
ISBN/EAN: 9789048181124

ISBN - escritura alterna:
90-481-8112-7, 978-90-481-8112-4
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: markov, chang, hui kai
Título del libro: error design, function circuits, electrical engineering, hui kai


Datos del la editorial

Autor: Kai-hui Chang; Igor L. Markov; Valeria Bertacco
Título: Lecture Notes in Electrical Engineering; Functional Design Errors in Digital Circuits - Diagnosis Correction and Repair
Editorial: Springer; Springer Netherland
200 Páginas
Año de publicación: 2010-10-28
Dordrecht; NL
Impreso en
Idioma: Inglés
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXIV, 200 p.

BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; formal verification; integrated circuit; layout; simulation; verification; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Logic Design; Computer-Aided Design (CAD); Rechnerarchitektur und Logik-Entwurf; BB; EA

Background and Prior Art.- Current Landscape in Design and Verification.- Finding Bugs and Repairing Circuits.- FogClear Methodologies and Theoretical Advances in Error Repair.- Circuit Design and Verification Methodologies.- Counterexample-Guided Error-Repair Framework.- Signature-Based Resynthesis Techniques.- Symmetry-Based Rewiring.- FogClear Components.- Bug Trace Minimization.- Functional Error Diagnosis and Correction.- Incremental Verification for Physical Synthesis.- Post-Silicon Debugging and Layout Repair.- Methodologies for Spare-Cell Insertion.- Conclusions.
Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solutions: from RTL to post-silicon debugging The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources First empirical comparison of several methods for spare-cell insertion A variety of examples and figures to illustrate key concepts and algorithms

< para archivar...